Sampling techniques for the analysis of microscopic foreign substances.
We will report rapid analysis results using various sampling techniques regarding foreign substances that have a significant impact on the yield of electronics products.
■Special Sampling Techniques for Foreign Substances in Multilayer Films - Foreign substances buried in metal films on substrates Metal film etching ⇒ Transfer to Si wafer ⇒ FT-IR analysis - Foreign substances in multilayer thin films Cutting off the surface layer ⇒ Transfer to Si wafer ⇒ FT-IR analysis Microtome/FIB thinning ⇒ Transfer to Si wafer ⇒ FT-IR analysis
- 企業：アイテス
- 価格：Other
